JPH0289378U - - Google Patents
Info
- Publication number
- JPH0289378U JPH0289378U JP17060488U JP17060488U JPH0289378U JP H0289378 U JPH0289378 U JP H0289378U JP 17060488 U JP17060488 U JP 17060488U JP 17060488 U JP17060488 U JP 17060488U JP H0289378 U JPH0289378 U JP H0289378U
- Authority
- JP
- Japan
- Prior art keywords
- input
- output pin
- delay
- circuit
- evaluated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011156 evaluation Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17060488U JPH0289378U (en]) | 1988-12-27 | 1988-12-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17060488U JPH0289378U (en]) | 1988-12-27 | 1988-12-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0289378U true JPH0289378U (en]) | 1990-07-16 |
Family
ID=31461697
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17060488U Pending JPH0289378U (en]) | 1988-12-27 | 1988-12-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0289378U (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003067273A1 (fr) * | 2002-02-06 | 2003-08-14 | Fujitsu Limited | Procede de diagnostic de tolerance de gigue, et dispositif correspondant |
-
1988
- 1988-12-27 JP JP17060488U patent/JPH0289378U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003067273A1 (fr) * | 2002-02-06 | 2003-08-14 | Fujitsu Limited | Procede de diagnostic de tolerance de gigue, et dispositif correspondant |